A new probe station of the EPS150MMW type from Form Factor company was purchased for the department. It is a probe station with manual control, robust construction and very precise positioners for performing sub-THz measurements. Accessories include alumina calibration substrates for vector network analyzer calibrations up to 110 GHz and a total of four air coplanar probes (ACP) with various dimensions and frequency bands applicability. In conjunction with our other measuring devices, the probe station significantly expands the set of circuits that can be measured. They are mainly microwave circuits made on alumina with thin-film technology, but also microwave chips themselves. Thanks to the universal probes of the ACP series, which can withstand relatively large mechanical unevenness of the measured circuits, or its contact pads, microwave circuits made on printed circuit boards can also be measured.
