EMRP Research Excelence Grant SIB62-REG1

  • Funded by: EAM SIB62-REG1
  • Duration: 2013-2016, external website
  • Total amount (cca 99 000 EUR for CTU)

Prime Contractor

  • NPL Management Limited, (NPL), United Kingdom acting as JRP-Coordinator for the JRP-Consortium



  • NPL Management Limited, (NPL), United Kingdom
  • Physikalisch-Technische Bundesanstalt, (PTB), Germany
  • Eidgenössisches Institut für Metrologie, (METAS),  Switzerland
  • Laboratoire national de métrologie et d’essais, (LNE), France
  • VSL B.V. (VSL), Netherlands
  • SP Sveriges Tekniska Forskningsinstitut AB (SP), Sweden
  • Cesky Metrologicky Institut Brno, (CMI), Czech Republic
  • Agilent, Agilent Technologies Österreich GmbH, Austria
  • Rohde & Schwarz GmbH & Co KG, (R&S), Germany
Research Excelence Grant (REG) partners
  • ULE, UK,
  • KUL, Belgium,
  • CTU, Czech Republic

About Project

C3 WP3: Traceable Differential S-parameter Measurements on Planar Circuits to Test Signal Integrity (NPL, PTB, LNE, CMI, R&S, REG(CTU))
  • Integrity (NPL, PTB, LNE, CMI, R&S, REG(CTU))
Task 3.3: Modelling and measurement uncertainty
  • Integrity (NPL, LNE, CMI, REG(CTU))
  • (Start Apr 14, End Apr 16)

The aims of this task are to apply modelling techniques to predict the performance of balanced calibration standards and to use this information (along with other sources of information) to establish uncertainties for differential S-parameter measurements. Modelling techniques will also be used by REG(CTU) to predict the influence of radiations from the interconnects on uncertainties of calibrations and measurements. Modelling EMRP

C4 WP4: Traceable Nonlinear Measurements and Extreme Load Impedances
  • (NPL, CMI, Agilent Belgium, REG(CTU), REG(KU Leuven))
  • (Start Jul 13, End Apr 16)

The aim of this WP is to establish traceability for new quantities emerging in measurement of nonlinear devices and traceability for measurements of impedances significantly lower or greater than the reference impedance of 50 ohms that is used in conventional systems. In particular, a traceable harmonic load-pull reference for nonlinear device characterisation will be established and metrology techniques for measurement of ‘extreme’ impedances using conventional VNAs will be developed. Since this WP covers two areas of measurement – i.e. nonlinear and extreme load impedances – almost independently of each other, the WP is therefore sub-divided into two sub-WPs covering these two areas.